|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsStackable USB Digital Storage Oscilloscope10 April 2018 - Advantech introduced a USB digital storage oscilloscopes which provides 200MHz bandwidth and up to 1GS/s sample rate. It also equips up to 128MS/ch waveform memory for high speed data acquisition. The 2 channel oscilloscope is in two versions available: as USB-DSO1 with 8-bit vertical resolution and as USB-DSO2 with 16-bit resolution. High-Speed Tester for next Generation LP-DDR5 and DDR5 Memories09 April 2018 – Advantest introduced its T5503HS2 memory tester, the industry’s most productive test solution for the fastest memory devices available today as well as next-generation, super-high-speed DRAMs. The new system’s flexibility extends the capabilities of the T5503 product family in the current “super cycle,” in which global demand for memories is skyrocketing. Test Application Framework with new Tools and Backup Capabilities06 April 2018 - Alfamation launched the latest version, 4.0, of its Supernova Test Application Framework software, which unleashes the power of NI TestStand. The new version adds new tools and backup capabilities, improved performance and more flexible administration features. Supernova is a configuration-based automated test environment that integrates with NI’s TestStand test management software to simplify access to high-end test capabilities. Affordable Mixed Signal Oscilloscopes with 1 GSa/s Sampling Rate05 April 2018 - B&K Precision announced their latest digital oscilloscope 2560 Series with DSO and MSO models. The oscilloscopes feature a sampling rate of 1 GSa/s, a bandwith of 200 MHz, 14 Mpts record length, and optional decoding. Test of LTE Cat-M1 and NB-IoT Devices04 April 2018 – Anritsu Corporation introduces multiple software packages for its Radio Communications Analyzer MT8821C that support emerging LTE Category M1 (LTE Cat-M1) and Narrowband IoT (NB-IoT) designs to create a highly efficient testing environment for LTE Cat-M1 and NB-IoT chipset and device verification. The LTE Cat-M1 and NB-IoT support expands the test capability of the MT8821C, and provides IoT-terminal and chipset manufacturers as well as communications operators with an all-in-one solution that can speed development of IoT devices. General Purpose Digitizers with Sampling Rate up to 125 MS/s03 April 2018 - Spectrum Instrumentation announced the addition of five new models to its general purpose M2p.59xx series of PCIe 16-bit digitizer cards. The new versions extend the performance range by increasing the maximum sampling rate from 80 MS/s up to 125 MS/s. The increased sampling rate, together with higher overall bandwidth, enables the new cards to capture a wider range of electronic signals. It makes them ideal for use in applications where signals in the DC to 50 MHz frequency range. Testing Service for CMOS Image Sensor Wafers30 March 2018 - Testing CMOS image sensors on a wafer-size scale is not easy because of the challenges of creating uniform illumination over a large area. Presto Engineering has developed a custom, computer-controlled solution that illuminates sections of the wafer in turn. Integrating the results enables the whole wafer to be tested automatically for an array of large sensors or even sensors that are right up to the size of an entire 12-inch wafer. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |