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Latest Test and Measurement NewsLabVIEW NXG with new Functionality12 March 2018 – National Instruments (NI) announced a new release of LabVIEW NXG, the next generation of LabVIEW engineering system design software. Engineers can now test smarter with LabVIEW NXG - quickly set up instruments, customize tests to device specifications, and easily view results from any web browser, on any device. All-in-One Solution for EMI/EMC Compliance Testing09 March 2018 -- Tektronix introduced EMCVu, a new all-in-one solution for EMI/EMC pre-compliance testing and troubleshooting. In today's electronic design environment, about 50 percent of products fail electromagnetic compatibility (EMC) testing the first time. EMCVu gives engineers an accurate, convenient and cost-effective approach to determine if their product designs will pass EMC emission compliance testing on the first try. Contactors for Testing Wafer Level Chip Scale Packages08 March 2018 - Multitest introduced the Gemini Kelvin 050 for 0.5mm pitch contacting for packages with continuously shrinking dies, which are needed for smaller, lower current, and faster end-user devices. The Gemini Kelvin contactor is very versatile and can be configured for: single site test, strip test, and multisite WLCSP test. Optical Sensor Head for Power Testing in free Space07 March 2018 - Yokogawa launched a new high performance optical sensor head for its modular optical test platform AQ2200. The large-diameter optical sensor head with best-in-class uncertainty for measurements in free space joins Yokogawa’s existing family of optical power meters modules (AQ2200-215 and AQ2200-221) in the company’s modular optical test platform. Signaling Test Solution for Bluetooth LE06 March 2018 - Many manufacturers of Bluetooth LE components find it challenging to test modules and sensors in compliance with the standard. These devices often have no connection for a control line, which is necessary for testing them in direct test mode (DTM) as stipulated by the Bluetooth LE standard. The R&S CMW270 wireless connectivity tester from Rohde & Schwarz now enables over-the-air (OTA) tests on Bluetooth LE devices, same as for Bluetooth Classic devices, a function already implemented in the tester. Increased Test Coverage for SPEA Flying Prober System05 March 2018 - GOEPEL electronic extends the integration of Embedded JTAG Solutions to SPEA 4050 Flying Probe Systems. This enables the combination of the Boundary Scan test technology with the Flying Probe test. That makes the SPEA 4050 system a cost and time efficient test platform for electrical assemblies in production. Anritsu partners with Trescal in The Netherlands02 March 2018 - Anritsu announced that their partnership with Trescal has been expanded to cover The Netherlands. Trescal will now be providing calibration and repair services for Anritsu Handheld RF products including the Site Master range of handheld Cable and Antenna Analysers, and the Master series of handheld Vector Network and Spectrum Analysers. More Articles ...
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