|
||||
News and Information about the Test of Electronics in Research & Design, Production, Maintenance, and Installation. | ||||
Main MenuNewsletterNews AreaInfo AreaWeblinksProduct Focus |
Readers Top 5 News of last 30 days
Latest Test and Measurement NewsHioki announces five New Digital Multimeters12 April 2013 - Hioki E.E. Corporation presented five new DMMs consisting of the Digital Multimeter DT4250 and DT4220 Series that meet a wide range of applications ranging from HVAC, DC, R&D to field testing. Last December Hioki launched the DT4280 Series featuring two DMMs designed for use in maintenance inspections of electrical equipment and in R&D work targeting inverters and solar power systems. Now Hioki is further enhancing its line of digital multimeters by launching two new series--the standard DT4250 Series and the pocket-style DT4220 Series. KLA-Tencor expands Litho/Etch Process Control Portfolio12 April 2013 - KLA-Tencor Corporation announced its SpectraShape 9000 optical critical dimension (CD) metrology system and BDR300 backside defect inspection and review module. The SpectraShape 9000 is a new metrology system capable of monitoring the shapes of three-dimensional transistors, memory cells and other key structures that enable high-performance memory and microprocessor chips. The BDR300 inspects and reviews the back side of the wafer for defects that can cause patterning problems on the wafer's front side. The two new systems are designed to enable volume production of integrated circuits at sub-20nm design rules. First ETSI standard compliant Certification Test Solution for 2.4 GHz Band11 April 2013 — Diverse radio services such as WLAN and Bluetooth as well as radio remote controls and wireless devices share the 2.4 GHz band, which is unlicensed and being more and more widely utilized. Since radio channels interfere with each other to an increasing extent, the ETSI EN 300 328 standard has been revised. Existing scenarios have been modified, and special tests for verifying improved coexistence behavior have been introduced. On December 31, 2014, the standard will become mandatory for all devices using this frequency band and being sold in the European Union. Wireless Communications Test Set with integrated Multiport Adapter11 April 2013 – Agilent Technologies introduced its new E6607C EXT wireless communications test set, featuring an integrated multiport adapter for cost-effective, high-volume wireless device manufacturing test. Optimized for testing multiple devices simultaneously, the EXT-C with integrated multiport adapter enables up to 3x gain in effective test throughput (vs. the EXT-B) for less than 1.3x the price. Tektronix presents Precision Multi-Phase Power Analyzer10 April 2013 – Only short time after the announcement to enter the power analyzer market, Tektronix presented the first product. Its new precision multi-phase Power Analyzer allows current measurements up to 30ARMS, voltages up to 1,000 VRMS and harmonics measurements up to the 100th harmonic. Featuring the Spiral Shunt design (patent application submitted), the Tektronix PA4000 Power Analyzer gives power electronics engineers stable, precise current measurements even on highly distorted power waveforms common in many applications. Wayne Kerr launches new entry level Products for Component Testing10 April 2013 - Wayne Kerr Electronics has established a new product line, eWayneKerr, that offers engineering and manufacturing firms an option to acquire low cost, yet feature rich test equipment at affordable prices. eWayneKerr employs a streamlined manufacturing process which allows it to build quality products with little overhead. All products sold through eWayneKerr are fully backed by Wayne Kerr Electronics. Anritsu launches new LTE-Advanced Measurement Software09 April 2013 – Anritsu Corporation announced the commercial release of their new LTE-Advanced Measurement Software for the MT8820C Radio Communication Analyzer. The MX882012C-021 software suite offers mobile device developers and manufacturers the world’s first all-in-one tester solution for LTE-Advanced call-processing tests, including receiver and RF throughput test solutions. More Articles ...
Related Articles: |
Upcoming Events More events...
Tag CloudOscilloscope
JTAG
Boundary Scan
Goepel
PXI
Rohde & Schwarz
Tektronix
Keysight
AOI
Anritsu
National Instruments
Inspection
Teledyne LeCroy
Aeroflex
LTE
Yokogawa
AXI
Spectrum Analyzer
Keithley
In-Circuit-Test
Signal Analyzer
Automotive
EMC-Test
Signal Generator
Advantest
Multitest
B&K Precision
Corelis
Power Supply
SPI
Flying Prober
Teseq
Cognex
Switching
Teradyne
Viscom
Pickering
Fluke
GAO Tek
PCIe
|
||
© All about Test 2018 |