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Readers Top 5 News of last 30 days
Latest Test and Measurement News7 and 12 MHz DDS Sweep Function Generators for Basic Applications06 February 2013 - B&K Precision announced two new DDS (direct digital synthesis) sweep function generators, models 4007B and 4013B, which improve upon the former models 4007DDS and 4013DDS with an enhanced user interface as well as lower prices. Models 4007B and 4013B can generate sine and square waveforms from 0.1 Hz to 7 MHz and 0.1 Hz to 12 MHz respectively. Both models also output triangle/ramp waveforms from 0.1 Hz to 1 MHz and provide variable output voltages from 0 to 10 Vpp into 50 ohms or 20 Vpp into open circuit. USB 2.0 Signal-Quality Test Option05 February 2013 – Agilent Technologies introduced the industry’s lowest-priced USB 2.0 signal-quality test option. This option for the InfiniiVision 4000 X-Series oscilloscopes supports low-speed, full-speed and hi-speed USB applications. The USB interface is used extensively for computer applications and for a broad range of embedded connectivity applications. AT4 wireless invests in 3G and LTE Test Equipment05 February 2013 - AT4 wireless and Anritsu have recently closed an agreement to bring Anritsu test equipment for 3G and LTE conformance and carrier testing to the AT4 network of testing laboratories. The agreement includes RF, RRM and Protocol testing equipment which will be located in Spain, USA, Taiwan and Japan. Update for free JTAG/Boundary Scan Tools04 February 2013 - JTAG Technologies offers a new release of its free JTAG Live Buzz tool. The new JTAG Live V1.6 features include an automatic chain detect that can interrogate multiple boundary-scan chains to determine the number of components in each plus their manufacturer and type. Another new feature is multi-language support. Now users from Japan, Germany, Russia, France, China, Holland and Portugal can get up and running in their native language. Coupling/Decoupling Network for Telecom Surge Testing04 February 2013 - Teseq designed a new CDN (coupling/decoupling network) for surge testing on unshielded symmetrical high speed telecommunication lines including Ethernet. The CDN HSS-2 enables convenient surge testing with 1.2/50 µs pulses on active telecom lines. Ideal for use in laboratories, Teseq’s CDN HSS-2 is compliant with IEC 61000-4-5 and is compatible with all industry standard surge generators. Flexible Probing Platform for On-Wafer Device Measurement01 February 2013 — Cascade Microtech announced the CM300, a flexible on-wafer measurement platform that scales to meet evolving needs in capability and automation. It enhances device and process characterization and modeling by capturing the true electrical performance of devices and enabling hands-off productivity. 30 GHz Probing System for 4th Generation Serial Data Measurements01 February 2013 – Tektronix announced the industry’s lowest noise and highest bandwidth 30 GHz probing system with coaxial connectors. The new P7600 Series Probing System features probe-specific DSP filters that enhance performance and minimize noise levels. When paired with the Tektronix DPO/DSA73304D oscilloscope, the P7600 Series Probing System provides connectivity and signal fidelity for high speed differential signal measurements on serial bus designs like PCI Express. More Articles ...
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