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Readers Top 5 News of last 30 days
Latest Test and Measurement NewsOrbotech introduces Next Generation of PCB-AOI System24 January 2013 – Orbotech announced the introduction of its Discovery II automated optical inspection (AOI) series for bare printed circuit board production. The newest generation of the Discovery AOI product line, Discovery II delivers new capabilities for greater operational efficiency. Available in several models, Discovery II ensures high defect detection with full flexibility to handle today’s challenging MLB, QTA and HDI mass production. Real-Time Spectrum Analyzer for up to 26.5 and 15 GHz24 January 2013 – Tektronix announced low cost real-time spectrum analyzers with mid-range performance, featuring the industry’s most advanced signal discovery and triggering capabilities. Included in the expansion of the RSA5000 Real-Time Spectrum Analyzer Series are new 26.5 GHz and 15 GHz models along with the recently-announced 110 MHz bandwidth option that is now available on all Tektronix Real-Time Spectrum Analyzers. Test of LTE Signaling with IMS Functions, Audio and Video Quality23 January 2013 – Anritsu has made available a new extension to its Rapid Test Designer (RTD) solution that offers engineers a single supplier solution for testing LTE signaling with IMS functions, audio and video quality. The extension to RTD provides the fastest and most flexible way to test Rich Communications Services (RCS) on LTE devices during development. The unique test creation environment enables engineers to create tests 5-10 times faster than when using a traditional scripting language. Resistance Meter for Component and Equipment Testing23 January 2013 - HIOKI E.E. Corporation launched the resistance meter RM3544 and RM3548. Manufacturers of coils and inductors must measure DC resistance as part of the production process, and HIOKI developed the RM3544 Series and RM3548 to meet this need in different applications. Inline Programming System combined with Embedded Test22 January 2013 - GOEPEL electronic introduced additional RAPIDO series inline production systems for high-speed programming as well as board test based on the newest Embedded System Access (ESA) technologies. The new models named RPS3000-(x) support double-sided probing for up to 3000 nails. Non-volatile memories such as Flash, Microcontrollers (MCU) and Programmable Logic Devices (PLD) can be on-board programmed even faster and more reliably. NI releases Automated Test Outlook 201321 January 2013 – National Instruments released its Automated Test Outlook 2013 highlighting the company’s research into the latest test and measurement technologies and methodologies. The report examines trends affecting industries such as aerospace and defense, automotive, consumer electronics, semiconductor, telecommunications and transportation. Engineers and managers can use the report to take advantage of the latest strategies and best practices for optimizing any test organization. 32 Gb/s Multi-Channel Bit Error Rate Testers for 100G Networks18 January 2013 – Tektronix announced a new series of high-speed pattern generators and error detectors to support optical and serial data communications testing on signals as fast as 32 Gb/s. The new PPG3000 Series Pattern Generators and PED3000 Series Bit Error Detectors feature multi-channel pattern generation with channel-specific data programming ideal for critical margin testing on critical standards like 100G Ethernet, which require up to 4 channels. More Articles ...
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