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Readers Top 5 News of last 30 days
News - Component TestPower IC Test Platform16 November 2022 - Chroma ATE launched the next generation of its high-performance power IC test platform. The new Chroma 3650-S2 provides excellent power measurement features and up to 768 digital I/O and analog pins with a maximum power supply capacity of 3000V or 160A per channel. Test of Power Management ICs and High-voltage Devices26 October 2022 – Advantest launched the latest addition to its Extended Power Supply (XPS) card series: the DC Scale XPS128+HV. This universal voltage-current (VI) instrument combines a high channel count (128 channels per card) with per-channel voltage ranges of up to +24V creating a test solution that efficiently addresses the test requirements for high-voltage devices such as USB Power Delivery components and charger functionalities in power management ICs (PMICs). Precision DC Source Meter for Semiconductor Component Test19 October 2022 - GW Instek launched the new GSM-20H10 precision DC source meter to officially enter the source meter equipment market in order to showcase GW Instek's experience in power measurement applications, and the combined technological advantages of developing 6 1/2 DMM. By launching this product, GW Instek will compete with Keithley, NI, and Keysight source meter manufacturers on the semiconductor component testing market so as to provide engineers with digital source meters of high precision, high measurement speed and best cost performance ratio. Quality Inspection of µLED Modules30 September 2022 – Instrument Systems introduced its spectrally exhanced LumiTop 4000 2D imaging colorimeter for testing μLED arrays in AFS applications. The 12 MP camera simultaneously measures the individual LEDs of the array, and due to its high measurement speed, it avoids the temperature-dependence of high-performance LEDs. In combination with a high-end CAS 140D spectroradiometer, the system – calibrated to luminance (in cd/m2) – delivers highly accurate measured values. In particular, it is excellently suited to the quality control of the uniformity, brightness and color of μLED arrays. Advantest launches ACS Solution Store29 September 2022 – Advantest Corporation rolled out the Advantest ACS Solution Store, an advanced online platform that provides ease of access to ACS real-time data infrastructure solutions and software applications. Customers can conveniently discover, purchase and securely deploy all available ACS solutions from Advantest and a broad spectrum of analytics ecosystem partners across the semiconductor lifecycle process. In addition, the ACS Solution Store enables application developers from these partner firms to publish, promote, distribute and manage their Advantest-certified apps. New Device Modeling Software enables One-Stop Workflow22 September 2022 - Keysight Technologies announced a new model generator (MG) environment that increases productivity for semiconductor device modeling engineers with improved automation across the entire workflow. Semiconductor device modeling engineers require automated tools to create accurate simulation models and process design kits (PDK) for baseband and radio frequency (RF) integrated circuit (IC) designs that leverage both silicon (CMOS) and compound III-V technologies. On-Wafer Device Characterization Test Solution14 September 2022 - Rohde & Schwarz now offers a test solution for full RF performance characterization of the DUT on-wafer which combines the powerful R&S ZNA vector network analyzer from Rohde & Schwarz with an engineering probe systems from FormFactor. As a result, semiconductor manufacturers can perform reliable and repeatable on-wafer device characterization in the development phase, during product qualification and in production. More Articles ...
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