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Readers Top 5 News of last 30 days
News - Component TestInnovative Methodologies for High-Speed Scan and Software-Based Functional Testing25 June 2021 - Advantest Corporation is pilot testing a next-generation solution for performing both high-speed scan testing and software-driven functional device testing on the V93000 platform by leveraging the existing high-speed serial I/O interfaces on advanced integrated circuits (ICs). This novel approach can correlate scan testing results between established and new test routines, boot up and execute on-chip test software and achieve a seamless end-to-end data flow in conjunction with Advantest’s partners in electronic design automation (EDA). Reliable Characterization of Wide-Bandgap Semiconductors26 May 2021 - Keysight Technologies announced a customized gallium nitride (GaN) test board for the company's dynamic power device analyzer / double-pulse tester (PD1500A), enabling Tier 1 and OEM power converter designers to reduce prototype cycles and speed introduction of new products. The PD1500A is modular, allowing discrete silicon (Si) and silicon carbide (SiC) based power devices to be characterized. Now with a customized GaN test board, Keysight's PD1500A delivers repeatable and reliable characterization for faster switching devices. IC Test Contactor for Failure Analysis21 May 2021 - The Y-RED test contactor series from Yamaichi Electronics is growing. In addition to IC chip evaluation and validation, the focus is now on failure analysis applications and low inductance laboratory measurements. With decades of experience in designing full and semi-custom test contactors, the Y-RED combines high-grade technology and standardised single parts with simplified, user-friendly mounting procedure. Short-pulse Testing for temperature-sensitive high-power LEDs13 April 2021 – Spectroradiometers with minimum measurement times in the micro-second range and precise triggering are required for conducting short-pulse measurements. For this purpose, Instrument Systems developed the new CAS 125 spectroradiometer with CMOS sensor and specially tailored readout electronics. This enables significantly more precise characterization of high-current-density LEDs, high-power LEDs with reduced heat-dissipation capability, or high luminance LEDs in development and production. Universal DPS Pin Cards for SoC Test System28 Januar 2021 – Advantest announced that its DC Scale XPS256 Device Power Supply (DPS) card, developed for use with the V93000 EXA Scale SoC test system, is now ramping to production-volume test at leading makers of communications processors. Providing the industry’s first universal DPS pin capability, the XPS256 delivers high accuracy, performance and dynamic response for a variety of data-driven applications. Cloud-based Data Analysis Platform for Semiconductor Design and Production19 January 2021 – Advantest and its partner PDF Solutions Inc. introduced two new innovative cloud-based software solutions: the Advantest V93000 Dynamic Parametric Test (DPT) system powered by PDF Exensio DPT, and an edge high performance compute (HPC) system. These solutions are part of the newly introduced Advantest Cloud Solutions (ACS), an ecosystem of cloud-based products and services. At the core of this ecosystem is the data- and analytics-focused platform, Advantest Cloud powered by PDF Exensio, which Advantest is co-developing with PDF Solutions. Testing of D-PHY and C-PHY Imaging ICs for Smart Phone Cameras21 December 2020 – Advantest launched a new high-speed CMOS image capture module for its T2000 test platform that enables highly parallel, 64-site testing of both D-PHY and C-PHY devices for the rapidly growing smart phone market. The new T2000 4.8-Gbps CMOS image capture module, known as the 4.8GICAP, is designed to efficiently transfer data from CMOS image sensors (CIS) to the T2000 tester’s high-performance image processor engine (IPE). More Articles ...
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