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Readers Top 5 News of last 30 days
News - Component TestEnergy-saving Battery Testing28 February 2013 - The Energy-Pump-Charging-Discharging technology (EPCD) is a concept developed by FuelCon for minimizing the energy consumption in battery test fields. The TrueData-EPCD combines all functionalities and applications of a charge/ discharge unit for single cell testing with the innovative EPCD concept for resource-friendly operation of battery test fields enabling enormous energy cost savings with reduction of the test station operating costs up to 70 %. Electron-Beam Inspection System for Wafer Inspection07 February 2013 - KLA-Tencor Corporation announced the eS805, a new electron-beam inspection system for leading-edge chip manufacturers. The eS805 offers strong capability in detection of very small defects and defects that cause electrical problems in the integrated circuit, such as opens, shorts or reliability issues. The eS805 is also designed to provide supplementary information to the fab's optical inspection systems, with the goal of boosting the ability of the optical inspectors to preferentially capture defects that matter. Flexible Probing Platform for On-Wafer Device Measurement01 February 2013 — Cascade Microtech announced the CM300, a flexible on-wafer measurement platform that scales to meet evolving needs in capability and automation. It enhances device and process characterization and modeling by capturing the true electrical performance of devices and enabling hands-off productivity. Resistance Meter for Component and Equipment Testing23 January 2013 - HIOKI E.E. Corporation launched the resistance meter RM3544 and RM3548. Manufacturers of coils and inductors must measure DC resistance as part of the production process, and HIOKI developed the RM3544 Series and RM3548 to meet this need in different applications. MVTS Technologies acquires Electroglas Wafer Prober Assets14 January 2013 - Global service and technology solutions provider MVTS Technologies has acquired the Electroglas wafer prober assets from Zenovus Pte. Ltd. and will now provide global sales and service for the Electroglas 4080, 4090, 4090u, 4090u+ and 6000 product lines. Under the terms of the asset purchase agreement, MVTS has acquired all global inventory and goodwill, in addition to retaining key directors and employees. Low-Cost Testing of Integrated Microcontroller and Smart Card ICs09 January 2013 - Semiconductor test equipment supplier Advantest Corporation has introduced its new T2000 Integrated Massive Parallel test solution (IMS), a test system capable of achieving the lowest cost of test for microcontroller units with integrated analog and embedded flash memory circuits. Designed to enable large-scale testing of up to 256 devices simultaneously, Advantest's new test solution achieves high throughput and fast test times with a parallel efficiency target of more than 99 percent. “Green” Regenerative Battery Test System09 January 2013 - NH Research introduced recently its 9200 Battery Test System that is capable of recuperating energy in Sink (Battery Discharge) mode and deliver back to the Utility Grid. In addition the 9200 system eliminates the need for additional cooling like power consuming air conditioners or water cooling to remove waste heat associated with traditional high power battery test systems. The saving is double. More Articles ...
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